Different elements emit characteristic X-rays of different energies and wavelengths, so by measuring the energy or wavelength of the X-rays, it is possible to know what element emits them and to carry out a qualitative analysis of the element. At the same time, the characteristic X-ray intensity of an element emitted by a sample after excitation is related to the content of this element in the sample, so its intensity can be measured for quantitative analysis of the element.

Therefore, there are two basic types of X-ray fluorescence spectrometers:

Wavelength dispersive (WD-XRF) and Energy dispersive (ED-XRF).

A distinction is made between the two types of X-ray fluorescence spectrometers

WD-XRF: Steel, Cement

ED-XRF:

1. RoHS detection and analysis (rapid screening of materials in the enterprise environmental protection Pb Cd Hg Total Cr Total Br + halogen Cl);

2. (Copper, stainless steel, etc.) composition analysis;

3. plating detection (thickness measurement of metal plating, plating solution and plating content determination);

4. precious metal testing (content testing of precious metals such as gold, platinum, silver and various types of jewellery);

5. soil/solid waste/coal testing.